Alla Sologubenko: Katalogdaten im Frühjahrssemester 2019

NameFrau Dr. Alla Sologubenko
ETH Zürich, HPM C 57.3
Otto-Stern-Weg 3
8093 Zürich
Telefon+41 44 633 68 12

227-0390-00LElements of Microscopy4 KP3GM. Stampanoni, G. Csúcs, A. Sologubenko
KurzbeschreibungThe lecture reviews the basics of microscopy by discussing wave propagation, diffraction phenomena and aberrations. It gives the basics of light microscopy, introducing fluorescence, wide-field, confocal and multiphoton imaging. It further covers 3D electron microscopy and 3D X-ray tomographic micro and nanoimaging.
LernzielSolid introduction to the basics of microscopy, either with visible light, electrons or X-rays.
InhaltIt would be impossible to imagine any scientific activities without the help of microscopy. Nowadays, scientists can count on very powerful instruments that allow investigating sample down to the atomic level.
The lecture includes a general introduction to the principles of microscopy, from wave physics to image formation. It provides the physical and engineering basics to understand visible light, electron and X-ray microscopy.
During selected exercises in the lab, several sophisticated instrument will be explained and their capabilities demonstrated.
LiteraturAvailable Online.
327-2128-00LHigh Resolution Transmission Electron Microscopy Belegung eingeschränkt - Details anzeigen
Number of participants limited.
2 KP3GA. Sologubenko, R. Erni, R. Schäublin, M. Willinger
KurzbeschreibungDieser Fortgeschrittenenkurs für hochauflösende Transmissionselektronenmikroskopie (HRTEM) bietet Vorlesungen, die sich auf HRTEM- und HRSTEM-Bildgebungsprinzipien, die zugehörige Datenanalyse und Simulation, sowie Phasenwiederherstellungsmethoden konzentrieren.
Lernziel- Learning how HRTEM and HRSTEM images are obtained.
- Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them.
- Learning about TEM and STEM images simulation software.
- Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
InhaltThis course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them.

1. Introduction to HRTEM and HRSTEM
2. Considerations on (S)TEM instrumentation for high resolution imaging
3. Lectures on aberrations, aberration correction and aberration corrected images
4. HRTEM and HRSTEM simulation
5. Data analysis, phase restoration and lattice-strain analysis
Literatur- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009
- Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016
- Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015.
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM TEM basic course
- Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science)
- Prior TEM experience