Karsten Kunze: Katalogdaten im Herbstsemester 2017

NameHerr Dr. Karsten Kunze
Adresse
ScopeM
ETH Zürich, HPM D 46
Otto-Stern-Weg 3
8093 Zürich
SWITZERLAND
Telefon+41 44 632 56 95
E-Mailkarsten.kunze@scopem.ethz.ch
DepartementErdwissenschaften
BeziehungDozent

NummerTitelECTSUmfangDozierende
327-0702-00LEM-Practical Course in Materials Science2 KP4PK. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler
KurzbeschreibungPraktische Arbeit am TEM und SEM, selbständiges Bearbeiten von typischen Fragestellungen, Auswertung der Daten, Schreiben eines Reports und Lernjournal
LernzielAnwendung grundlegender elektronenmikroskopischer Techniken im Bereich materialwissenschaftlicher Fragestellungen
Literatursiehe LE Electron Microscopy (327-0703-00L)
Voraussetzungen / BesonderesBesuch der LE Electron Microscopy (327-0703-00L) wird empfohlen.
Maximale Teilnehmerzahl 15, Arbeit in 3-er Gruppen.
327-0703-00LElectron Microscopy in Material Science4 KP2V + 2UK. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich
KurzbeschreibungA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
LernzielA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
InhaltThis course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported.
Skriptwill be distributed in English
LiteraturGoodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000
Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014
Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013
Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008
Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015)
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Belegung eingeschränkt - Details anzeigen
Number of participants limited to 9.

Master students will have priority over PhD students. PhD students may still enrol, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html).
2 KP3PS. Rodighiero, A. G. Bittermann, L. Grafulha Morales, K. Kunze, J. Reuteler
KurzbeschreibungDer Einführungskurs in Rasterelektronenmikroskopie (SEM) betont praktisches Lernen. Die Studierenden haben die Möglichkeit an zwei Elektronenmikroskopen ihre eigenen Proben oder Standard-Testproben zu untersuchen, sowie von ScopeM-Wissenschafler vorbereitete Übungen zu lösen.
Lernziel- Set-up, align and operate a SEM successfully and safely.
- Accomplish imaging tasks successfully and optimize microscope performances.
- Master the operation of a low-vacuum and field-emission SEM and EDX instrument.
- Perform sample preparation with corresponding techniques and equipment for imaging and analysis
- Acquire techniques in obtaining secondary electron and backscatter electron micrographs
- Perform EDX qualitative and semi-quantitative analysis
InhaltDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized.

- Discussion of students' sample/interest
- Introduction and discussion on Electron Microscopy and instrumentation
- Lectures on electron sources, electron lenses and probe formation
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM
- Brief description and demonstration of the SEM microscope
- Practice on beam/specimen interaction, image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping
- Practice on real-world samples and report results
Literatur- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
651-1851-00LEinführung in die Rasterelektronenmikroskopie1 KP2GK. Kunze, L. Martin
Kurzbeschreibung
LernzielEinführung in die Rasterelektronenmikroskopie und Mikrobereichsanalyse. Erwerb praktischer Fertigkeiten in der selbständigen Bedienung eines REM.
InhaltFunktionsweise und die wesentlichen Betriebsarten eines Rasterelektronenmikroskopes. Methoden und Einsatzzwecke zur
- Abbildung (SE, BSE, FSE, AE, KL),
- Röntgen-Spektroskopie (EDX),
- Elektronen-Beugung (EBSD, Channeling, Orientation Imaging).
Methoden zur Probenpräparation.
Praktische Übungen
SkriptBeilagen und Bedienungsunterlagen werden während des Kurses abgegeben
Literatur- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996).
- Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994).
- Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973).
- Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981).
Voraussetzungen / BesonderesGanztägiger Blockkurs nach Ende des HS
651-4111-00LRock Physics Information 3 KP2GA. S. Zappone, L. Grafulha Morales, K. Kunze, C. Madonna
KurzbeschreibungRock Physics provides the understanding to connect geomechanical and geophysical data to the intrinsic properties of rocks, such as mineral composition and texture. Rock Physics is a key component in geo-resources exploration and exploitation, and in geo-hazard assessment.
LernzielThe objective of this course is to introduce Rock Physics as a laboratory and interpretive tool.
InhaltThe course will introduce and combine principles from geophysics, structural geology, crystallography, applied mathematics, and other disciplines. The intrinsic properties of rocks, such as mineralogy, porosity, pore fluids, crystallographic orientation, microstructures and textures, will be connected to physical parameters controlling the permeability, the thermal and elastic properties of rocks, both at the scale of the single specimen and at the scale of geological formations. The nature and origin of anisotropy of physical properties will be discussed. Real data examples will be used to present a variety of case studies and applications. Lectures will alternate with laboratory demonstrations.
Voraussetzungen / BesonderesUndergraduate courses in the following subjects are highly recommended in order to get the most out of this specialist course:

- Basic structural Geology
- Geophysics
- Mineralogy/Crystallography